Fred A. Stevie: search on Z-Library

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1

Introduction to Focused Ion Beams ||

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 103.84 MB

english, 2005

2

Electron backscatter diffraction of Nb 3 Sn coated niobium: Revealing structure as a function of depth

Tuggle, Jay, Pudasaini, Uttar, Angle, Jonathan, Eremeev, Grigory, Reece, Charlie E., Stevie, Fred A., Kelley, Michael J.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2019

Language:

english

File:

PDF, 8.51 MB

english, 2019

3

Introduction to Focused Ion Beams || Dual-Beam (FIB-SEM) Systems

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 9.69 MB

english, 2005

4

Introduction to Focused Ion Beams || Three-Dimensional Nanofabrication Using Focused Ion Beams

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 3.26 MB

english, 2005

5

Analysis of permethrin treated fabric using ToF-SIMS

Zhou, Chuanzhen, Stevie, Fred, Garcia, Roberto

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2020

File:

PDF, 4.37 MB

2020

6

SIMS depth profiling of deuterium labeled polymers in polymer multilayers

Shane E. Harton, Fred A. Stevie, Dieter P. Griffis, Harald Ade

Journal:

Applied Surface Science

Year:

2006

Language:

english

File:

PDF, 222 KB

english, 2006

7

Preface

Jerry Hunter, Bruno W. Schueler, Fred A. Stevie

Journal:

Applied Surface Science

Year:

2004

Language:

english

File:

PDF, 48 KB

english, 2004

8

XPS analysis of FIB-milled Si

Amy C. Ferryman, Julia E. Fulghum, Lucille A. Giannuzzi, Fred A. Stevie

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 331 KB

english, 2002

9

Introduction to Focused Ion Beams || FIB for Materials Science Applications - a Review

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 10.90 MB

english, 2005

10

Introduction to Focused Ion Beams || Device Edits and Modifications

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 4.06 MB

english, 2005

11

Introduction to Focused Ion Beams || FIB Lift-Out Specimen Preparation Techniques

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 9.67 MB

english, 2005

12

Introduction to Focused Ion Beams || Ion - Solid Interactions

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 9.18 MB

english, 2005

13

Photoelectron spectroscopy of coordination compounds. Triphenylphosphine and its complexes

Blackburn, John R., Nordberg, Ragnar, Stevie, Fred, Albridge, Royal G., Jones, Mark Martin

Journal:

Inorganic Chemistry

Year:

1970

Language:

english

File:

PDF, 391 KB

english, 1970

14

TOF SIMS analyses of stray Ga during FIB milling

Santeufemio, Christopher, Gorman, Brian P., Zhou, Chuanzhen, Giannuzzi, Lucille A., Stevie, Fred A.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2013

Language:

english

File:

PDF, 1.03 MB

english, 2013

15

Tailoring of electron and hole energies in strained GaAsP/AlGaAs quantum wells using fluorine-impurity-induced layer disordering

Das, Utpal, Davis, Steve, Ramaswamy, Ramu V., Stevie, Fred A.

Journal:

Applied Physics Letters

Year:

1992

Language:

english

File:

PDF, 544 KB

english, 1992

16

Introduction to Focused Ion Beams || The Focused Ion Beam Instrument

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 3.39 MB

english, 2005

17

Redistribution of Implanted Species in Polycrystalline Silicon Films on Silicon Substrate

Salman, F., Arnold, J., Zhang, Peng, Chai, Guan Gyu, Stevie, Fred A., Chow, L.

Journal:

Defect and Diffusion Forum

Year:

2007

Language:

english

File:

PDF, 369 KB

english, 2007

18

Diffusion of Implanted Metals in Tantalum Silicide

Salman, F., Zhang, Peng, Stevie, Fred A., Chow, L.

Journal:

Defect and Diffusion Forum

Year:

2007

File:

PDF, 597 KB

2007

19

Introduction to Focused Ion Beams || The Uses of Dual Beam FIB in Microelectronic Failure Analysis

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 12.88 MB

english, 2005

20

Introduction to Focused Ion Beams || A FIB Micro-Sampling Technique and a Site Specific TEM Specimen Preparation Method

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 6.46 MB

english, 2005

21

Introduction to Focused Ion Beams || Practical Aspects of FIB Tem Specimen Preparation

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 9.06 MB

english, 2005

22

Introduction to Focused Ion Beams || Focused Ion Beam Secondary Ion Mass Spectrometry (FIB-SIMS)

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 2.78 MB

english, 2005

23

Introduction to Focused Ion Beams || High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 2.39 MB

english, 2005

24

Introduction to Focused Ion Beams || Focused Ion Beam Gases for Deposition and Enhanced Etch

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 4.95 MB

english, 2005

25

Introduction to Focused Ion Beams || Quantitative Three-Dimensional Analysis Using Focused Ion Beam Microscopy

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 4.39 MB

english, 2005

26

Introduction to Focused Ion Beams || Application of FIB in Combination with Auger Electron Spectroscopy

Giannuzzi, Lucille A., Stevie, Fred A.

Year:

2005

Language:

english

File:

PDF, 7.86 MB

english, 2005

27

A Wide Area Scanning Atomic Force Profiler

Batchelor, A D, Galhouse, Brian, Griffis, Dieter P, Stevie, Fred A, Russell, Phillip E

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 227 KB

english, 2004

28

Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS

Sedláček, Libor, Kološová, Jolana, Jiruše, Jaroslav, Stevie, Fred A.

Journal:

Microscopy and Microanalysis

Year:

2014

Language:

english

File:

PDF, 1.02 MB

english, 2014

29

SIMS measurement of hydrogen and deuterium detection limits in silicon: Comparison of different SIMS instrumentation

Stevie, Fred A., Zhou, Chaunzhen, Hopstaken, Marinus, Saccomanno, Michael, Zhang, Zhichun, Turansky, Andrew

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2016

Language:

english

File:

PDF, 857 KB

english, 2016

30

ToF-SIMS quantification of bromine based insecticide in mosquito netting

Zhou, Chuanzhen, Stevie, Fred A., Smith, Stephen C.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2017

Language:

english

File:

PDF, 1.24 MB

english, 2017

31

ToF-SIMS analysis of ion implanted standard to quantify insecticide in mosquito netting with cesium and argon gas cluster sputtering beams

Zhou, Chuanzhen, Stevie, Fred A., Smith, Stephen C., Rading, Derk, Zakel, Julia

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2018

Language:

english

File:

PDF, 1.40 MB

english, 2018

32

ChemInform Abstract: PHOTOELEKTRONENSPEKTROSKOPIE VON KOORDINATIONSVERBINDUNGEN, TRIPHENYLPHOSPHIN UND SEINE KOMPLEXE

BLACKBURN, JOHN R., NORDBERG, RAGNAR, STEVIE, FRED, ALBRIDGE, ROYAL G., JONES, MARK M.

Journal:

Chemischer Informationsdienst. Organische Chemie

Year:

1970

File:

PDF, 127 KB

1970

33

Quantification of organic materials by ion implantation

Zhou, Chuanzhen, Stevie, Fred A., Smith, Stephen C.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2018

Language:

english

File:

PDF, 869 KB

english, 2018

34

Secondary ion mass spectrometry for superconducting radiofrequency cavity materials

Tuggle, Jay, Pudasaini, Uttar, Stevie, Fred A., Kelley, Michael J., Palczewski, Ari D., Reece, Charlie E.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2018

Language:

english

File:

PDF, 4.21 MB

english, 2018

35

Encyclopedia of Materials Characterization || Surface Roughness

STEVIE, FRED A.

Year:

1992

Language:

english

File:

PDF, 1.26 MB

english, 1992

36

Imaging and quantitative analysis of insecticide in mosquito net fibers using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

Smith, Stephen C., Zhou, Chuanzhen, Stevie, Fred A., Garcia, Roberto, Xu, Bing

Journal:

Year:

2018

Language:

english

File:

PDF, 3.57 MB

english, 2018

37

FIB Sample Preparation for In Depth EDS Analysis

Garcia, Roberto, Stevie, Fred A., Giannuzzi, Lucille

Journal:

Microscopy and Microanalysis

Year:

2019

Language:

english

File:

PDF, 438 KB

english, 2019

38

[AIP Advanced processing and characterization technologies - Clearwater, Florida (USA) (8−10 May 1991)] AIP Conference Proceedings - Tailoring of electron and hole energies in strained GaAsP/AlGaAs quantum wells using fluorine impurity induced layer disordering

Das, Utpal, Davis, Steven, Hsu, Jia-T., Ramaswamy, Ramu V., Stevie, Fred A.

Year:

1991

File:

PDF, 539 KB

1991

39

Sample handling, preparation and mounting for XPS and other surface analytical techniques

Stevie, Fred A., Garcia, Roberto, Shallenberger, Jeffrey, Newman, John G., Donley, Carrie L.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2020

File:

PDF, 11.61 MB

2020

40

Introduction to x-ray photoelectron spectroscopy

Stevie, Fred A., Donley, Carrie L.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2020

File:

PDF, 3.35 MB

2020